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[/] [genesys_ddr2/] [trunk/] [rtl/] [ipcore_dir/] [MEMCtrl/] [user_design/] [sim/] [ddr2_tb_test_gen.v] - Blame information for rev 3

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//*****************************************************************************
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// DISCLAIMER OF LIABILITY
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//
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// This file contains proprietary and confidential information of
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// Xilinx, Inc. ("Xilinx"), that is distributed under a license
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// from Xilinx, and may be used, copied and/or disclosed only
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// pursuant to the terms of a valid license agreement with Xilinx.
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//
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// XILINX IS PROVIDING THIS DESIGN, CODE, OR INFORMATION
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// ("MATERIALS") "AS IS" WITHOUT WARRANTY OF ANY KIND, EITHER
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// EXPRESSED, IMPLIED, OR STATUTORY, INCLUDING WITHOUT
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// LIMITATION, ANY WARRANTY WITH RESPECT TO NONINFRINGEMENT,
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// MERCHANTABILITY OR FITNESS FOR ANY PARTICULAR PURPOSE. Xilinx
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// does not warrant that functions included in the Materials will
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// meet the requirements of Licensee, or that the operation of the
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// Materials will be uninterrupted or error-free, or that defects
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// in the Materials will be corrected. Furthermore, Xilinx does
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// not warrant or make any representations regarding use, or the
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// results of the use, of the Materials in terms of correctness,
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// accuracy, reliability or otherwise.
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//
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// Xilinx products are not designed or intended to be fail-safe,
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// or for use in any application requiring fail-safe performance,
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// such as life-support or safety devices or systems, Class III
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// medical devices, nuclear facilities, applications related to
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// the deployment of airbags, or any other applications that could
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// lead to death, personal injury or severe property or
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// environmental damage (individually and collectively, "critical
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// applications"). Customer assumes the sole risk and liability
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// of any use of Xilinx products in critical applications,
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// subject only to applicable laws and regulations governing
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// limitations on product liability.
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//
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// Copyright 2006, 2007 Xilinx, Inc.
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// All rights reserved.
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//
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// This disclaimer and copyright notice must be retained as part
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// of this file at all times.
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//*****************************************************************************
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//   ____  ____
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//  /   /\/   /
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// /___/  \  /    Vendor: Xilinx
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// \   \   \/     Version: 3.6.1
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//  \   \         Application: MIG
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//  /   /         Filename: ddr2_tb_test_gen.v
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// /___/   /\     Date Last Modified: $Date: 2010/11/26 18:26:02 $
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// \   \  /  \    Date Created: Fri Sep 01 2006
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//  \___\/\___\
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//
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//Device: Virtex-5
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//Design Name: DDR2
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//Purpose:
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//   This module instantiates the addr_gen and the data_gen modules. It takes
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//   the user data stored in internal FIFOs and gives the data that is to be
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//   compared with the read data
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//Reference:
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//Revision History:
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//*****************************************************************************
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`timescale 1ns/1ps
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module ddr2_tb_test_gen #
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  (
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   // Following parameters are for 72-bit RDIMM design (for ML561 Reference 
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   // board design). Actual values may be different. Actual parameters values 
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   // are passed from design top module MEMCtrl module. Please refer to
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   // the MEMCtrl module for actual values.
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   parameter BANK_WIDTH    = 2,
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   parameter COL_WIDTH     = 10,
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   parameter DM_WIDTH      = 9,
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   parameter DQ_WIDTH      = 72,
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   parameter APPDATA_WIDTH = 144,
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   parameter ECC_ENABLE    = 0,
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   parameter ROW_WIDTH     = 14
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   )
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  (
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   input                                  clk,
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   input                                  rst,
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   input                                  wr_addr_en,
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   input                                  wr_data_en,
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   input                                  rd_data_valid,
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   output                                 app_af_wren,
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   output [2:0]                           app_af_cmd,
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   output [30:0]                          app_af_addr,
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   output                                 app_wdf_wren,
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   output [APPDATA_WIDTH-1:0]             app_wdf_data,
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   output [(APPDATA_WIDTH/8)-1:0]         app_wdf_mask_data,
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   output [APPDATA_WIDTH-1:0]             app_cmp_data
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   );
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  //***************************************************************************
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  ddr2_tb_test_addr_gen #
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    (
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     .BANK_WIDTH (BANK_WIDTH),
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     .COL_WIDTH  (COL_WIDTH),
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     .ROW_WIDTH  (ROW_WIDTH)
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     )
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    u_addr_gen
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      (
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       .clk         (clk),
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       .rst         (rst),
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       .wr_addr_en  (wr_addr_en),
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       .app_af_cmd  (app_af_cmd),
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       .app_af_addr (app_af_addr),
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       .app_af_wren (app_af_wren)
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       );
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  ddr2_tb_test_data_gen #
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    (
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     .DM_WIDTH      (DM_WIDTH),
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     .DQ_WIDTH      (DQ_WIDTH),
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     .APPDATA_WIDTH (APPDATA_WIDTH),
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     .ECC_ENABLE    (ECC_ENABLE)
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     )
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    u_data_gen
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      (
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       .clk               (clk),
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       .rst               (rst),
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       .wr_data_en        (wr_data_en),
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       .rd_data_valid     (rd_data_valid),
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       .app_wdf_wren      (app_wdf_wren),
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       .app_wdf_data      (app_wdf_data),
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       .app_wdf_mask_data (app_wdf_mask_data),
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       .app_cmp_data      (app_cmp_data)
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       );
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endmodule

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