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[/] [mips_enhanced/] [trunk/] [grlib-gpl-1.0.19-b3188/] [designs/] [leon3-asic/] [README.txt] - Blame information for rev 2

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Dual-use pins in test mode:
 
 
scanin   -> dsurx
scanout  -> dsutx
scanen   -> dsubre
testrst  -> dsuen
inoutct  -> rxd1
testmode -> test
scanclk  -> clk
 
 
Memory tests
------------
 
All on-chip RAM blocks are tested by writing and checking
the following values: 0x55555555, 0xAAAAAAAA, address pattern.
This will insure that all bits are tested to both 0 and 1,
and that the address decoder is tested. Additional patterns
can be added but will result in increased number of test
vectors.

Line No.	Rev	Author	Line
1	2	dimamali
2
3			`Dual-use pins in test mode:`
4
5
6			`scanin -> dsurx`
7			`scanout -> dsutx`
8			`scanen -> dsubre`
9			`testrst -> dsuen`
10			`inoutct -> rxd1`
11			`testmode -> test`
12			`scanclk -> clk`
13
14
15			`Memory tests`
16			`------------`
17
18			`All on-chip RAM blocks are tested by writing and checking`
19			`the following values: 0x55555555, 0xAAAAAAAA, address pattern.`
20			`This will insure that all bits are tested to both 0 and 1,`
21			`and that the address decoder is tested. Additional patterns`
22			`can be added but will result in increased number of test`
23			`vectors.`

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[/] [mips_enhanced/] [trunk/] [grlib-gpl-1.0.19-b3188/] [designs/] [leon3-asic/] [README.txt] - Blame information for rev 2