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[/] [openrisc/] [trunk/] [gnu-dev/] [or1k-gcc/] [gcc/] [testsuite/] [gcc.target/] [spu/] [dfcgt-nan.c] - Blame information for rev 695

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Line No. Rev Author Line
1 691 jeremybenn
/* { dg-do compile } */
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/* { dg-options "-march=celledp -O1" } */
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/* { dg-final { scan-assembler "dfceq" } } */
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/* GCC previously transformed an "a <= b" test into "! (a > b)" when
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   compiling with -march=celledp, so that the dfcgt instruction can be
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   used to implement the comparison.
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   However, this transformation violates the IEEE-754 standard in the
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   presence of NaN values.  If either a or b is a NaN, a <= b should
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   evaluate to false according to IEEE rules.  However, after the
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   transformation, a > b as implemented by dfcgt itself returns false,
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   so the transformed test returns true.
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   Note that the equivalent transformation is valid for single-
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   precision floating-point values on the Cell SPU, because the format
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   does not have NaNs.  It is invalid for double-precision, even on
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   Cell, however.  */
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int test (double a, double b) __attribute__ ((noinline));
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int test (double a, double b)
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{
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  return a <= b;
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}
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int main (void)
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{
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  double x = 0.0;
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  double y = 0.0/0.0;
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  return test (x, y);
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}

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