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[/] [test_project/] [trunk/] [linux_sd_driver/] [include/] [linux/] [mtd/] [bbm.h] - Blame information for rev 62

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1 62 marcus.erl
/*
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 *  linux/include/linux/mtd/bbm.h
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 *
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 *  NAND family Bad Block Management (BBM) header file
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 *    - Bad Block Table (BBT) implementation
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 *
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 *  Copyright (c) 2005 Samsung Electronics
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 *  Kyungmin Park <kyungmin.park@samsung.com>
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 *
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 *  Copyright (c) 2000-2005
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 *  Thomas Gleixner <tglx@linuxtronix.de>
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 *
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 */
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#ifndef __LINUX_MTD_BBM_H
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#define __LINUX_MTD_BBM_H
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/* The maximum number of NAND chips in an array */
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#define NAND_MAX_CHIPS          8
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/**
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 * struct nand_bbt_descr - bad block table descriptor
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 * @options:            options for this descriptor
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 * @pages:              the page(s) where we find the bbt, used with
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 *                      option BBT_ABSPAGE when bbt is searched,
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 *                      then we store the found bbts pages here.
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 *                      Its an array and supports up to 8 chips now
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 * @offs:               offset of the pattern in the oob area of the page
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 * @veroffs:            offset of the bbt version counter in the oob area of the page
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 * @version:            version read from the bbt page during scan
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 * @len:                length of the pattern, if 0 no pattern check is performed
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 * @maxblocks:          maximum number of blocks to search for a bbt. This
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 *                      number of blocks is reserved at the end of the device
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 *                      where the tables are written.
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 * @reserved_block_code: if non-0, this pattern denotes a reserved
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 *                      (rather than bad) block in the stored bbt
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 * @pattern:            pattern to identify bad block table or factory marked
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 *                      good / bad blocks, can be NULL, if len = 0
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 *
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 * Descriptor for the bad block table marker and the descriptor for the
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 * pattern which identifies good and bad blocks. The assumption is made
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 * that the pattern and the version count are always located in the oob area
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 * of the first block.
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 */
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struct nand_bbt_descr {
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        int options;
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        int pages[NAND_MAX_CHIPS];
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        int offs;
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        int veroffs;
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        uint8_t version[NAND_MAX_CHIPS];
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        int len;
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        int maxblocks;
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        int reserved_block_code;
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        uint8_t *pattern;
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};
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/* Options for the bad block table descriptors */
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/* The number of bits used per block in the bbt on the device */
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#define NAND_BBT_NRBITS_MSK     0x0000000F
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#define NAND_BBT_1BIT           0x00000001
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#define NAND_BBT_2BIT           0x00000002
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#define NAND_BBT_4BIT           0x00000004
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#define NAND_BBT_8BIT           0x00000008
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/* The bad block table is in the last good block of the device */
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#define NAND_BBT_LASTBLOCK      0x00000010
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/* The bbt is at the given page, else we must scan for the bbt */
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#define NAND_BBT_ABSPAGE        0x00000020
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/* The bbt is at the given page, else we must scan for the bbt */
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#define NAND_BBT_SEARCH         0x00000040
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/* bbt is stored per chip on multichip devices */
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#define NAND_BBT_PERCHIP        0x00000080
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/* bbt has a version counter at offset veroffs */
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#define NAND_BBT_VERSION        0x00000100
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/* Create a bbt if none axists */
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#define NAND_BBT_CREATE         0x00000200
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/* Search good / bad pattern through all pages of a block */
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#define NAND_BBT_SCANALLPAGES   0x00000400
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/* Scan block empty during good / bad block scan */
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#define NAND_BBT_SCANEMPTY      0x00000800
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/* Write bbt if neccecary */
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#define NAND_BBT_WRITE          0x00001000
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/* Read and write back block contents when writing bbt */
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#define NAND_BBT_SAVECONTENT    0x00002000
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/* Search good / bad pattern on the first and the second page */
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#define NAND_BBT_SCAN2NDPAGE    0x00004000
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/* The maximum number of blocks to scan for a bbt */
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#define NAND_BBT_SCAN_MAXBLOCKS 4
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/*
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 * Constants for oob configuration
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 */
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#define ONENAND_BADBLOCK_POS    0
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/*
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 * Bad block scanning errors
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 */
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#define ONENAND_BBT_READ_ERROR          1
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#define ONENAND_BBT_READ_ECC_ERROR      2
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#define ONENAND_BBT_READ_FATAL_ERROR    4
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/**
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 * struct bbm_info - [GENERIC] Bad Block Table data structure
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 * @bbt_erase_shift:    [INTERN] number of address bits in a bbt entry
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 * @badblockpos:        [INTERN] position of the bad block marker in the oob area
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 * @options:            options for this descriptor
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 * @bbt:                [INTERN] bad block table pointer
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 * @isbad_bbt:          function to determine if a block is bad
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 * @badblock_pattern:   [REPLACEABLE] bad block scan pattern used for
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 *                      initial bad block scan
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 * @priv:               [OPTIONAL] pointer to private bbm date
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 */
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struct bbm_info {
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        int bbt_erase_shift;
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        int badblockpos;
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        int options;
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        uint8_t *bbt;
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        int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
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        /* TODO Add more NAND specific fileds */
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        struct nand_bbt_descr *badblock_pattern;
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        void *priv;
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};
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/* OneNAND BBT interface */
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extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
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extern int onenand_default_bbt(struct mtd_info *mtd);
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#endif  /* __LINUX_MTD_BBM_H */

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