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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_136.vhd] - Blame information for rev 3

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1 3 david237
-----------------------------------------------------------------------
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-- Bipolar TTL models (VHDL)                                         --
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-- David R Brooks                                                    --
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-- June, 2016.  Perth, Australia                                     --
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-- Compliance: VHDL 2008                                             --
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-- Testbench for SN74LS136N: Quad 2-input XOR gate (open collector)  --
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-----------------------------------------------------------------------
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library ieee;
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    use ieee.std_logic_1164.all;
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    use ieee.std_logic_misc.all;
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    use ieee.numeric_std.all;
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    use work.LSTTL.all;
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    use work.TTLPrivate.all;
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entity Testbench_136 is     -- Top-level bench
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generic(
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    StimClk  : std_logic      := '1';
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    CheckClk : std_logic      := '0';
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    Period   : time           := 100 ns;
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    Finish   : time           :=  20 us;
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    SevLevel : severity_level := failure
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);
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end entity;
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architecture Test of Testbench_136 is
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    signal J, B : unsigned(7 downto 0);         -- Test stimuli
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    signal D, E : std_logic_vector(3 downto 0); -- Expected & actual results
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    begin
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    -----------------------------------------------------------------------
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    -- Standard testbench components
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    -----------------------------------------------------------------------
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    TB: TTLBench
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    generic map(
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        StimClk  => StimClk,
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        CheckClk => CheckClk,
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        Period   => Period,
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        Finish   => Finish,
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        SevLevel => SevLevel
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    )
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    port map(
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        J    => J,
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        B    => B,
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        CLK  => open,
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        RS   => open,
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        D    => D,
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        E    => E
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    );
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    -----------------------------------------------------------------------
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    -- Generate expected results (with zero delays)
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    -----------------------------------------------------------------------
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    D(0) <= TTL_OC( J(0) xor J(1) );
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    D(1) <= TTL_OC( J(2) xor J(3) );
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    D(2) <= TTL_OC( J(4) xor J(5) );
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    D(3) <= TTL_OC( J(6) xor J(7) );
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    -----------------------------------------------------------------------
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    -- Device Under Test...                        
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    -----------------------------------------------------------------------
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    DUT: SN74LS136N
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    port map(
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    X_1  => J(0),  -- 1A
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    X_2  => J(1),  -- 1B
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    X_3  => E(0),  -- 1Y\
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    X_4  => J(2),  -- 2A
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    X_5  => J(3),  -- 2B
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    X_6  => E(1),  -- 2Y\
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    X_7  => open,  -- GND
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    X_8  => E(2),  -- 3Y\
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    X_9  => J(4),  -- 3B
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    X_10 => J(5),  -- 3A
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    X_11 => E(3),  -- 4Y\
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    X_12 => J(6),  -- 4B
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    X_13 => J(7),  -- 4A
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    X_14 => open   -- Vcc 
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);
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end architecture Test;

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