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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_140.vhd] - Blame information for rev 11

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1 3 david237
-----------------------------------------------------------------------
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-- Bipolar TTL models (VHDL)                                         --
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-- David R Brooks                                                    --
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-- June, 2016.  Perth, Australia                                     --
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-- Compliance: VHDL 2008                                             --
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-- Testbench for SN74S140N: Dual 4-input NAND line driver            --
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-----------------------------------------------------------------------
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library ieee;
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    use ieee.std_logic_1164.all;
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    use ieee.std_logic_misc.all;
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    use ieee.numeric_std.all;
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    use work.LSTTL.all;
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    use work.TTLPrivate.all;
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entity Testbench_140 is     -- Top-level bench
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generic(
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    StimClk  : std_logic      := '1';
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    CheckClk : std_logic      := '0';
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    Period   : time           := 50 ns;
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    Finish   : time           := 20 us;
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    SevLevel : severity_level := failure
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);
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end entity;
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architecture Test of Testbench_140 is
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    signal J, B : unsigned(7 downto 0);         -- Test stimuli
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    signal D, E : std_logic_vector(1 downto 0); -- Expected & actual results
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    begin
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    -----------------------------------------------------------------------
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    -- Standard testbench components
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    -----------------------------------------------------------------------
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    TB: TTLBench
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    generic map(
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        StimClk  => StimClk,
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        CheckClk => CheckClk,
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        Period   => Period,
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        Finish   => Finish,
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        SevLevel => SevLevel
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    )
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    port map(
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        J   => J,
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        B   => B,
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        CLK => open,
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        RS  => open,
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        D   => D,
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        E   => E
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    );
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    -----------------------------------------------------------------------
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    -- Generate expected results (with zero delays)
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    -----------------------------------------------------------------------
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    D(0) <= not( J(0) and J(1) and J(2) and J(3) );
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    D(1) <= not( J(4) and J(5) and J(6) and J(7) );
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    -----------------------------------------------------------------------
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    -- Device Under Test...                        
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    -----------------------------------------------------------------------
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    DUT: SN74S140N
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    port map(
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    X_1  => J(0),  -- 1A
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    X_2  => J(1),  -- 1B
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                   -- 
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    X_4  => J(2),  -- 1C
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    X_5  => J(3),  -- 1D
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    X_6  => E(0),  -- 1Y\
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    X_7  => open,  -- GND
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    X_8  => E(1),  -- 2Y\
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    X_9  => J(4),  -- 2D
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    X_10 => J(5),  -- 2C
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                   -- 
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    X_12 => J(6),  -- 2B
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    X_13 => J(7),  -- 2A
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    X_14 => open   -- Vcc
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);
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end architecture Test;

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