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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_194.vhd] - Blame information for rev 4

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1 3 david237
-----------------------------------------------------------------------
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-- Bipolar TTL models (VHDL)                                         --
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-- David R Brooks                                                    --
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-- August, 2016.  Perth, Australia                                   --
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-- Compliance: VHDL 2008                                             --
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-- Testbench for SN74LS194N: 4-bit bidirectional shift register      --
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-----------------------------------------------------------------------
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library ieee;
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    use ieee.std_logic_1164.all;
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    use ieee.std_logic_misc.all;
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    use ieee.numeric_std.all;
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    use work.LSTTL.all;
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    use work.TTLPrivate.all;
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entity Testbench_194 is     -- Top-level bench
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generic(
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    StimClk  : std_logic      := '1';
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    CheckClk : std_logic      := '1';
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    Period   : time           := 100 ns;
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    Finish   : time           :=  15 us;
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    SevLevel : severity_level := failure
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);
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end entity;
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architecture Test of Testbench_194 is
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    signal JC, BC  : unsigned(7 downto 0);           -- Test stimuli
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    signal D,  E   : std_logic_vector(3 downto 0);   -- Expected & actual results
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    signal P       : unsigned(3 downto 0);
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    signal CLK, RS : std_logic;
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    signal S       : std_logic_vector(1 downto 0);
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    signal DR, DL  : std_logic;
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    -- NB Q3 is considered the rightmost bit (see data sheet)
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    signal M, R, Q : unsigned(0 to 3);
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    begin
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    (DR, DL, P) <= BC(5 downto 0);
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    S(0)        <= and_reduce(std_logic_vector(JC(4 downto 0)));
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    S(1)        <= nor_reduce(std_logic_vector(JC(4 downto 0)));
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    -----------------------------------------------------------------------
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    -- Standard testbench components
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    -----------------------------------------------------------------------
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    TB: TTLBench
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    generic map(
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        StimClk  => StimClk,
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        CheckClk => CheckClk,
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        Period   => Period,
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        Finish   => Finish,
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        SevLevel => SevLevel
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   )
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    port map(
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        J    => JC,
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        B    => BC,
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        CLK  => CLK,
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        RS   => RS,
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        D    => D,
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        E    => E
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   );
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    -----------------------------------------------------------------------
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    -- Generate expected results (with zero delays)
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    -----------------------------------------------------------------------
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    M <= P(3) & P(2) & P(1) & P(0);
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    with S select R <=
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        M              when "11",   -- Load
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        Q(1 to 3) & DL when "10",   -- Left
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        DR & Q(0 to 2) when "01",   -- Right
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        Q              when others; -- Hold
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    process(CLK, RS) is
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    begin
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        if RS = '0' then
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            Q <= (others => '0');
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        elsif rising_edge(CLK) then
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            Q <= R;
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        end if;
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    end process;
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    (D(3), D(2), D(1), D(0)) <= Q;
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    -----------------------------------------------------------------------
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    -- Device Under Test...                        
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    -----------------------------------------------------------------------
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    DUT: SN74LS194N
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    port map(
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        X_1  => RS,   -- MR\
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        X_2  => DR,   -- DSR
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        X_3  => P(0), -- P0
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        X_4  => P(1), -- P1
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        X_5  => P(2), -- P2
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        X_6  => P(3), -- P3
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        X_7  => DL,   -- DSL
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        X_8  => open, -- GND
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        X_9  => S(0), -- S(0)
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        X_10 => S(1), -- S(1)
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        X_11 => CLK,  -- CP
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        X_12 => E(3), -- Q3
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        X_13 => E(2), -- Q2
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        X_14 => E(1), -- Q1
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        X_15 => E(0), -- Q0
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        X_16 => open  -- Vcc
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   );
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end architecture Test;

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