Subversion Repositories ttl_library

-----------------------------------------------------------------------

-- Bipolar TTL models (VHDL)                                         --

-- David R Brooks                                                    --

-- June, 2016.  Perth, Australia                                     --

-- Compliance: VHDL 2008                                             --

-- Testbench for SN74LS241N: Octal buffer/line driver (3-state ops)  --

-----------------------------------------------------------------------

library ieee;

    use ieee.std_logic_1164.all;

    use ieee.std_logic_misc.all;

    use ieee.numeric_std.all;

    use work.LSTTL.all;

    use work.TTLPrivate.all;

entity Testbench_241 is     -- Top-level bench

generic(

    StimClk  : std_logic      := '1';

    CheckClk : std_logic      := '1';

    Period   : time           := 50 ns;

    Finish   : time           := 20 us;

    SevLevel : severity_level := failure

);

end entity;

architecture Test of Testbench_241 is

    signal RS       : std_logic;

    signal CLK      : std_logic;

    signal JC, BC   : unsigned(9 downto 0);       -- Test stimuli

    signal D,  E    : std_logic_vector(7 downto 0);   -- Expected & actual results

    signal OEA, OEB : std_logic;

    signal IA,  IB  : std_logic_vector(3 downto 0);

begin

    OEA <= JC(9);

    OEB <= JC(8);

    IA  <= std_logic_vector(BC(4 downto 1));

    IB  <= std_logic_vector(BC(3 downto 0));

    -----------------------------------------------------------------------

    -- Standard testbench components

    -----------------------------------------------------------------------

    TB: TTLBench

    generic map(

        StimClk  => StimClk,

        CheckClk => CheckClk,

        Period   => Period,

        Finish   => Finish,

        SevLevel => SevLevel

    )

    port map(

        J    => JC,

        B    => BC,

        CLK  => CLK,

        RS   => RS,

        D    => D,

        E    => E

    );

    -----------------------------------------------------------------------

    -- Generate expected results (with zero delays)

    -----------------------------------------------------------------------

    GG: for j in IA'range generate

    begin

        D(j)   <= IA(j) when OEA = '0' else 'Z';

        D(j+4) <= IB(j) when OEB = '1' else 'Z';

    end generate;

    -----------------------------------------------------------------------

    -- Device Under Test...                        

    -----------------------------------------------------------------------

    DUT: SN74LS241N

    port map(

        X_1  => OEA,   -- OEA\

        X_2  => IA(0), -- IA0

        X_3  => E(4),  -- YB0

        X_4  => IA(1), -- IA1

        X_5  => E(5),  -- YB1

        X_6  => IA(2), -- IA2

        X_7  => E(6),  -- YB2

        X_8  => IA(3), -- IA3

        X_9  => E(7),  -- YB3

        X_10 => open,  -- GND

        X_11 => IB(3), -- IB3

        X_12 => E(3),  -- YA3

        X_13 => IB(2), -- IB2

        X_14 => E(2),  -- YA2

        X_15 => IB(1), -- IB1

        X_16 => E(1),  -- YA1

        X_17 => IB(0), -- IB0

        X_18 => E(0),  -- YA0

        X_19 => OEB,   -- OEB

        X_20 => open   -- Vcc

    );

end architecture Test;