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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_322.vhd] - Blame information for rev 10

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1 3 david237
-----------------------------------------------------------------------
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-- Bipolar TTL models (VHDL)                                         --
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-- David R Brooks                                                    --
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-- December, 2016.  Perth, Australia                                 --
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-- Compliance: VHDL 2008                                             --
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-- Testbench for SN74LS322N: 8 bit ser/par register + sign extend    --
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-----------------------------------------------------------------------
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library ieee;
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    use ieee.std_logic_1164.all;
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    use ieee.std_logic_misc.all;
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    use ieee.numeric_std.all;
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    use work.LSTTL.all;
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    use work.TTLPrivate.all;
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entity Testbench_322 is     -- Top-level bench
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generic(
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    StimClk  : std_logic      := '1';
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    CheckClk : std_logic      := '1';
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    Period   : time           := 40 ns;
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    Finish   : time           := 50 us;
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    SevLevel : severity_level := failure
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);
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end entity;
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architecture Test of Testbench_322 is
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    signal J,  B     : unsigned(14 downto 0);        -- Test stimuli
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    signal D,  E     : std_logic_vector(8 downto 0); -- Expected & actual results
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    signal RS, CLK   : std_logic;
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    signal OEI, DIN  : std_logic;
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    signal DI, R, DT : std_logic_vector(7 downto 0);
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    alias  RE  is J(8);
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    alias  SP  is J(9);
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    alias  D0  is J(10);
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    alias  D1  is J(11);
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    alias  OE  is J(12);
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    alias  SE  is J(13);
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    alias  S   is J(14);
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begin
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    OEI  <= (SP or RE) and not(OE);
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    DIN  <= D0 when S = '0' else D1;
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    DI   <= std_logic_vector(J(7 downto 0)) when OE  = '1' else (others => 'Z');
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    E    <= "Z" & DI;
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    DT   <= std_logic_vector(J(7 downto 0)) when OE  = '1' else
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            R                               when OEI = '1' else
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            (others => 'Z');
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    D    <= R(0) & DT;
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    -----------------------------------------------------------------------
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    -- Standard testbench components
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    -----------------------------------------------------------------------
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    TB: TTLBench
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    generic map(
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        StimClk  => StimClk,
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        CheckClk => CheckClk,
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        Period   => Period,
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        Finish   => Finish,
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        SevLevel => SevLevel
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    )
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    port map(
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        J   => J,
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        B   => B,
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        CLK => CLK,
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        RS  => RS,
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        D   => D,
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        E   => E
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    );
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    -----------------------------------------------------------------------
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    -- Generate expected results (with zero delays)
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    -----------------------------------------------------------------------
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    process(RS, CLK) is
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        variable SEL : unsigned(2 downto 0);
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    begin
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        if RS = '0' then
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            R <= (others => '0');
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        elsif rising_edge(CLK) then
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            SEL := RE & SP & SE;
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            case SEL is
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                when "011"   => R <= DIN  & R(7 downto 1);  -- Shift right
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                when "010"   => R <= R(7) & R(7 downto 1);  -- Shift left
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                when "00-"   => R <= DT;                    -- Parallel load
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                when others  => null;                       -- Hold
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            end case;
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        end if;
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    end process;
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    -----------------------------------------------------------------------
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    -- Device Under Test...                        
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    -----------------------------------------------------------------------
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    DUT: SN74LS322N
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    port map(
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        X_1  => RE,    -- RE\
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        X_2  => SP,    -- S/P\
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        X_3  => D0,    -- D0
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        X_4  => DI(7), -- IO7
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        X_5  => DI(5), -- IO5
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        X_6  => DI(3), -- IO3
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        X_7  => DI(1), -- IO1
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        X_8  => OE,    -- OE\
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        X_9  => RS,    -- MR\
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        X_10 => open,  -- GND
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        X_11 => CLK,   -- CP
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        X_12 => E(8),  -- Q0
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        X_13 => DI(0), -- IO0
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        X_14 => DI(2), -- IO2
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        X_15 => DI(4), -- IO4
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        X_16 => DI(6), -- IO6
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        X_17 => D1,    -- D1
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        X_18 => SE,    -- SE\
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        X_19 => S,     -- S
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        X_20 => open   -- Vcc
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    );
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end architecture Test;

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