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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_74.vhd] - Blame information for rev 3

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1 3 david237 
-----------------------------------------------------------------------
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-- Bipolar TTL models (VHDL)                                         --
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-- David R Brooks                                                    --
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-- June, 2016.  Perth, Australia                                     --
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-- Compliance: VHDL 2008                                             --
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-- Testbench for SN74LS74N: Dual D-type +ve edge-triggered flipflop  --
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-----------------------------------------------------------------------
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library ieee;
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    use ieee.std_logic_1164.all;
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    use ieee.std_logic_misc.all;
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    use ieee.numeric_std.all;
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    use work.LSTTL.all;
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    use work.TTLPrivate.all;
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entity Testbench_74 is     -- Top-level bench
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generic(
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    StimClk  : std_logic      := '1';
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    CheckClk : std_logic      := '0';
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    Period   : time           := 120 ns;
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    Finish   : time           :=  20 us;
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    SevLevel : severity_level := failure
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);
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end entity;
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architecture Test of Testbench_74 is
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    signal RS     : std_logic;
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    signal CLK    : std_logic;
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    signal JC, BC : unsigned(1 downto 0);           -- Test stimuli
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    signal D,  E  : std_logic_vector(3 downto 0);   -- Expected & actual results
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    begin
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    -----------------------------------------------------------------------
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    -- Standard testbench components
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    -----------------------------------------------------------------------
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    TB: TTLBench
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    generic map(
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        StimClk  => StimClk,
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        CheckClk => CheckClk,
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        Period   => Period,
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        Finish   => Finish,
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        SevLevel => SevLevel
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    )
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    port map(
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        J    => JC,
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        B    => BC,
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        CLK  => CLK,
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        RS   => RS,
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        D    => D,
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        E    => E
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    );
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    -----------------------------------------------------------------------
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    -- Generate expected results (with zero delays)
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    -----------------------------------------------------------------------
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    G: for i in 1 downto 0 generate
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    begin
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        SIM: process(CLK, RS) is
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        begin
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            if    RS = '0' then
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                D(i) <= '0';
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            elsif rising_edge(CLK) then
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                D(i) <= BC(i);
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            end if;
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        end process;
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        D(i+2) <= not D(i);
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    end generate;
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    -----------------------------------------------------------------------
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    -- Device Under Test...
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    -----------------------------------------------------------------------
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    DUT: SN74LS74N
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    port map(
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    X_1  => RS,    -- CD1\
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    X_2  => BC(0), -- D1
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    X_3  => CLK,   -- CP1
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    X_4  => '1',   -- SD1\
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    X_5  => E(0),  -- Q1
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    X_6  => E(2),  -- Q1\
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    X_7  => open,  -- GND
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    X_8  => E(3),  -- Q2\
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    X_9  => E(1),  -- Q2
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    X_10 => '1',   -- SD2\
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    X_11 => CLK,   -- CP2
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    X_12 => BC(1), -- D2
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    X_13 => RS,    -- CD2\
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    X_14 => open   -- Vcc
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);
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end architecture Test;

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