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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_374.vhd] - Rev 6
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----------------------------------------------------------------------- -- Bipolar TTL models (VHDL) -- -- David R Brooks -- -- December, 2016. Perth, Australia -- -- Compliance: VHDL 2008 -- -- Testbench for SN74LS374N: 8-bit D flipflop -- ----------------------------------------------------------------------- library ieee; use ieee.std_logic_1164.all; use ieee.std_logic_misc.all; use ieee.numeric_std.all; use work.LSTTL.all; use work.TTLPrivate.all; entity Testbench_374 is -- Top-level bench generic( StimClk : std_logic := '1'; CheckClk : std_logic := '0'; Period : time := 100 ns; Finish : time := 20 us; SevLevel : severity_level := failure ); end entity; architecture Test of Testbench_374 is signal J, B : unsigned(7 downto 0); -- Test stimuli signal D, E : std_logic_vector(7 downto 0); -- Expected & actual results signal R : std_logic_vector(7 downto 0); -- Latch signal CLK : std_logic; alias OE is J(0); begin ----------------------------------------------------------------------- -- Standard testbench components ----------------------------------------------------------------------- TB: TTLBench generic map( StimClk => StimClk, CheckClk => CheckClk, Period => Period, Finish => Finish, SevLevel => SevLevel ) port map( J => J, B => B, CLK => CLK, RS => open, D => D, E => E ); ----------------------------------------------------------------------- -- Generate expected results (with zero delays) ----------------------------------------------------------------------- process(CLK) is begin if rising_edge(CLK) then R <= std_logic_vector(B); end if; end process; D <= R when OE = '0' else (others => 'Z'); ----------------------------------------------------------------------- -- Device Under Test... ----------------------------------------------------------------------- DUT: SN74LS374N port map( X_1 => OE, -- OE\ X_2 => E(0), -- Q0 X_3 => B(0), -- D0 X_4 => B(1), -- D1 X_5 => E(1), -- Q1 X_6 => E(2), -- Q2 X_7 => B(2), -- D2 X_8 => B(3), -- D3 X_9 => E(3), -- Q3 X_10 => open, -- GND X_11 => CLK, -- CP X_12 => E(4), -- Q4 X_13 => B(4), -- D4 X_14 => B(5), -- D5 X_15 => E(5), -- Q5 X_16 => E(6), -- Q6 X_17 => B(6), -- D6 X_18 => B(7), -- D7 X_19 => E(7), -- Q7 X_20 => open -- Vcc ); end architecture Test;
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