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[/] [mips_enhanced/] [trunk/] [grlib-gpl-1.0.19-b3188/] [designs/] [leon3-asic/] [README.txt] - Rev 2
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Dual-use pins in test mode:
scanin -> dsurx
scanout -> dsutx
scanen -> dsubre
testrst -> dsuen
inoutct -> rxd1
testmode -> test
scanclk -> clk
Memory tests
------------
All on-chip RAM blocks are tested by writing and checking
the following values: 0x55555555, 0xAAAAAAAA, address pattern.
This will insure that all bits are tested to both 0 and 1,
and that the address decoder is tested. Additional patterns
can be added but will result in increased number of test
vectors.