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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_10.vhd] - Rev 4
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----------------------------------------------------------------------- -- Bipolar TTL models (VHDL) -- -- David R Brooks -- -- June, 2016. Perth, Australia -- -- Compliance: VHDL 2008 -- -- Testbench for SN74LS10N: Triple 3-input NAND gate (Pinout A) -- ----------------------------------------------------------------------- library ieee; use ieee.std_logic_1164.all; use ieee.std_logic_misc.all; use ieee.numeric_std.all; use work.LSTTL.all; use work.TTLPrivate.all; entity Testbench_10 is -- Top-level bench generic( StimClk : std_logic := '1'; CheckClk : std_logic := '0'; Period : time := 50 ns; Finish : time := 20 us; SevLevel : severity_level := failure ); end entity; architecture Test of Testbench_10 is signal J, B : unsigned(8 downto 0); -- Test stimuli signal D, E : std_logic_vector(2 downto 0); -- Expected & actual results begin ----------------------------------------------------------------------- -- Standard testbench components ----------------------------------------------------------------------- TB: TTLBench generic map( StimClk => StimClk, CheckClk => CheckClk, Period => Period, Finish => Finish, SevLevel => SevLevel ) port map( J => J, B => B, CLK => open, RS => open, D => D, E => E ); ----------------------------------------------------------------------- -- Generate expected results (with zero delays) ----------------------------------------------------------------------- D(0) <= not(J(0) and J(1) and J(2)); D(1) <= not(J(3) and J(4) and J(5)); D(2) <= not(J(6) and J(7) and J(8)); ----------------------------------------------------------------------- -- Device Under Test... ----------------------------------------------------------------------- DUT: SN74LS10N port map( X_1 => J(0), -- 1A X_2 => J(1), -- 1B X_3 => J(3), -- 2A X_4 => J(4), -- 2B X_5 => J(5), -- 2C X_6 => E(1), -- 2Y\ X_7 => open, -- GND X_8 => E(2), -- 3Y\ X_9 => J(6), -- 3C X_10 => J(7), -- 3B X_11 => J(8), -- 3A X_12 => E(0), -- 1Y\ X_13 => J(2), -- 1C X_14 => open -- Vcc ); end architecture Test;
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