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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_156.vhd] - Rev 5

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-----------------------------------------------------------------------
-- Bipolar TTL models (VHDL)                                         --
-- David R Brooks                                                    --
-- June, 2016.  Perth, Australia                                     --
-- Compliance: VHDL 2008                                             --
-- Testbench for SN74LS156N: Dual 1-of-4 decoder/demux (o/c)         --
-----------------------------------------------------------------------
 
library ieee;
    use ieee.std_logic_1164.all;
    use ieee.std_logic_misc.all;
    use ieee.numeric_std.all;
    use work.LSTTL.all;
    use work.TTLPrivate.all;
 
entity Testbench_156 is     -- Top-level bench
generic(
    StimClk  : std_logic      := '1'; 
    CheckClk : std_logic      := '1';
    Period   : time           :=  50 ns;
    Finish   : time           :=  20 us;
    SevLevel : severity_level := failure
);
end entity;
 
architecture Test of Testbench_156 is
    signal J, B : unsigned(5 downto 0);         -- Test stimuli
    signal D, E : std_logic_vector(7 downto 0); -- Expected & actual results
 
    begin
    -----------------------------------------------------------------------
    -- Standard testbench components
    -----------------------------------------------------------------------
    TB: TTLBench
    generic map(
        StimClk  => StimClk,  
        CheckClk => CheckClk,  
        Period   => Period,
        Finish   => Finish,
        SevLevel => SevLevel
    )
    port map(
        J   => J,
        B   => B,
        CLK => open,
        RS  => open,
        D   => D,
        E   => E
    );
 
    -----------------------------------------------------------------------
    -- Generate expected results (with zero delays)
    -----------------------------------------------------------------------
 
    process(B) is
        variable N      : natural range 3 downto 0;
        variable EA, EB : std_logic;
        variable X      : std_logic_vector(7 downto 0);
    begin
        N  := TTL_to_integer(B(5 downto 4));
        EA := B(0) and not B(1);
        EB := not(B(2) or B(3));
 
        X := (others => '1');
        X(N+4) := not EB;
        X(N)   := not EA;
 
        for i in X'range loop
            D(i) <= TTL_OC(X(i));
        end loop;
    end process;
 
    -----------------------------------------------------------------------
    -- Device Under Test...                        
    -----------------------------------------------------------------------
    DUT: SN74LS156N 
    port map(
    X_1  => B(0),  -- EA
    X_2  => B(1),  -- EA\
    X_3  => B(5),  -- A1
    X_4  => E(3),  -- O3A\
    X_5  => E(2),  -- O2A\
    X_6  => E(1),  -- O1A\
    X_7  => E(0),  -- O0A\
    X_8  => open,  -- GND
    X_9  => E(4),  -- O0B\
    X_10 => E(5),  -- O1B\
    X_11 => E(6),  -- O2B\
    X_12 => E(7),  -- O3B\
    X_13 => B(4),  -- A0
    X_14 => B(3),  -- EB2\
    X_15 => B(2),  -- EB1\
    X_16 => open   -- Vcc
);
end architecture Test;
 

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