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[/] [ttl_library/] [trunk/] [Testbench/] [Testbench_82.vhd] - Rev 10
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----------------------------------------------------------------------- -- Bipolar TTL models (VHDL) -- -- David R Brooks -- -- June, 2016. Perth, Australia -- -- Compliance: VHDL 2008 -- -- Testbench for SN7482N: 2-bit full adder -- ----------------------------------------------------------------------- library ieee; use ieee.std_logic_1164.all; use ieee.std_logic_misc.all; use ieee.numeric_std.all; use work.LSTTL.all; use work.TTLPrivate.all; entity Testbench_82 is -- Top-level bench generic( StimClk : std_logic := '1'; CheckClk : std_logic := '1'; Period : time := 100 ns; Finish : time := 20 us; SevLevel : severity_level := failure ); end entity; architecture Test of Testbench_82 is signal JC, BC : unsigned(4 downto 0); -- Test stimuli signal D, E : std_logic_vector(2 downto 0); -- Expected & actual results begin ----------------------------------------------------------------------- -- Standard testbench components ----------------------------------------------------------------------- TB: TTLBench generic map( StimClk => StimClk, CheckClk => CheckClk, Period => Period, Finish => Finish, SevLevel => SevLevel ) port map( J => JC, B => BC, CLK => open, RS => open, D => D, E => E ); ----------------------------------------------------------------------- -- Generate expected results (with zero delays) ----------------------------------------------------------------------- process(BC) is variable A, B, C : unsigned(2 downto 0); begin A := ('0', BC(1), BC(3)); B := ('0', BC(0), BC(2)); C := A + B + BC(4); (D(2), D(0), D(1)) <= C; end process; ----------------------------------------------------------------------- -- Device Under Test... ----------------------------------------------------------------------- DUT: SN7482N port map( X_1 => E(1), -- S1 X_2 => BC(3), -- A1 X_3 => BC(2), -- B1 X_4 => open, -- Vcc X_5 => BC(4), -- CIN -- -- -- -- X_10 => E(2), -- C2 X_11 => open, -- GND X_12 => E(0), -- S2 X_13 => BC(0), -- B2 X_14 => BC(1) -- A2 ); end architecture Test;
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